SiGlaz Announces the Release of SiGlaz Defect Navigator
SiGlaz offers a low-cost application for analysis of wafer defect data; the software targets companies with low-to-medium production volumes.


SANTA CLARA, CA, July 23, 2010 /24-7PressRelease/ -- SiGlaz, a leading provider of spatial signature analysis software to the semiconductor and hard disk drive industry, announced the release of a new software product that meets the defect and yield analysis needs of semiconductor fabs with low-to-medium production volumes. SiGlaz Defect Navigator, Professional Edition (SDN - P), provides the yield engineer with a range of functions to review and display standard data files generated by inline inspection and review systems.

In targeting the data analysis needs of smaller companies, John Poreda, SiGlaz Vice President of Sales and Marketing, said "Many companies have been relying upon in-house software tools with limited functionality to manage and analyze their inspection data. SDN now gives these companies an economical way to upgrade their data management and analysis capability."

SiGlaz Defect Navigator operates on a Windows-based PC (Windows XP or Windows 7), using .NET Framework 3.5. It contains an internal SQL ExpressTM database that allows the user to store up to 4 GBytes of defect inspection data. The software will continuously monitor a designated folder for incoming data files and automatically load the new files to the database. The user may query the database by multiple attributes from the inspection file (e.g., Lot ID, Device ID and Step ID) to create a data set.

SDN allows the user to configure the user interface to optimally view the data output. The user may simultaneously display multiple windows containing a stacked wafer map, a histogram, a thumbnail wafer gallery, a defect list or other important information. Stacked wafer map analysis provides a wafer map display containing all defects in the selected data set. The defects are color coded by various user-defined attributes and synchronized with the histogram. SDN drill down and drill across analysis functions allow the user to graphically select any bar on the histogram and create a new chart comprised of only the selected data. Defect Adder Analysis (DAA) allows the user to analyze and display how successive processing steps add or remove defects from the data set.

Poreda also noted that SiGlaz plans to continue to expand the functionality of SDN, adding optional plug-in modules; for example a scratch analyzer, a zonal analyzer and a repeater analyzer. He also noted that SDN could be customized to add work-in-process data (e.g., equipment process chamber) to the wafer record in the database so that the root cause process issues could be identified more easily.

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Press Release Contact Information:

John Poreda
SiGlaz Corp.
VP Sales & Marketing
2953 Bunker Hill Lane, Suite 400
Santa Clara, CA
USA 94556
Voice: 408-712-4172
Fax: 408-282-3501
Website: Visit Our Website